X-Ray Fluorescence (XRF)

JP Analytical offers X-Ray Fluorescence (XRF) as part of our integrated metrology services, providing rapid, non-destructive elemental composition and impurity analysis across a wide range of materials. By measuring characteristic X-rays emitted from a sample under excitation, XRF enables reliable identification and quantification of elements from trace levels to bulk concentrations.

Our XRF capability complements ion beam, surface, and structural techniques—supporting material verification, process monitoring, and quality control for semiconductor, thin-film, and advanced materials applications where accurate elemental information is essential.