Precision in Every Layer
At JP Analytical, we specialize in thin film metrology and semiconductor R&D, delivering tailored solutions that push the boundaries of material science.
“Measure the Invisible. Engineer the Future.”
Thin Films
Quantitative Thin-Film Metrology Powered by Ion Beam & Surface Analysis
RBS, HFS, and XPS deliver accurate composition, thickness, and interface insight — enabling faster product development, yield enhancement, and reliable failure analysis.
Semiconductor R&D
Advancing Semiconductor Innovation
Innovative research projects focused on semiconductor materials and device performance through precision metrology, defect passivation, thermal processing, and tailored R&D for next-generation technologies.
Custom Solutions
Tailored metrology services designed to meet specific client challenges in thin film and semiconductor research.
Gallery
Snapshots capturing our precision and dedication in materials research